0000000000147133
AUTHOR
S. Emonin
Reproducible optical fiber tips for photon scanning tunneling microscopy with very small (>5°) cone angle
Sharp optical fiber tips for photon scanning tunneling microscopes (PSTMs) have been fabricated by employing a new alternative technique for etching multimode optical fibers. The tip diameter is less than 30 mm, while the cone full-angle can be as sharp as 3/spl deg/. To the knowledge of the authors, such tips are the sharpest reported up to now. Measurements, with 19 tips, of the evanescent wave decay distance produced by frustrated reflection of light on a same sample, show good reproducibility. Furthermore, the PSTM images, taken with the new tips, are very sharp and fit with images of the same sample obtained with an atomic force microscope (AFM).
Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies
The combination of atomic-force and scanning-near-field optical microscopies is useful for characterizing the physical and optical parameters of optoelectronic devices. With a commercial atomic-force microscope adapted to perform scanning-near-field optical measurements, we succeed in determining core diameters, localizing the erbium doping zone, and analyzing propagation modes in erbium-doped and multimodal optical fibers.