6533b836fe1ef96bd12a0873
RESEARCH PRODUCT
Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies
S. EmoninC. ChicanneEric BourillotT. DavidJ. P. GoudonnetYvon LacrouteN. Richardsubject
Materials scienceOptical fiberMicroscopebusiness.industryPhysics::OpticsStatistical and Nonlinear PhysicsNear and far fieldChemical vapor depositionErbium dopingAtomic and Molecular Physics and OpticsPtychographylaw.inventionCharacterization (materials science)Core (optical fiber)Condensed Matter::Materials ScienceOpticslawbusinessdescription
The combination of atomic-force and scanning-near-field optical microscopies is useful for characterizing the physical and optical parameters of optoelectronic devices. With a commercial atomic-force microscope adapted to perform scanning-near-field optical measurements, we succeed in determining core diameters, localizing the erbium doping zone, and analyzing propagation modes in erbium-doped and multimodal optical fibers.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2000-09-01 | Journal of the Optical Society of America B |