0000000000184234
AUTHOR
Gineuve Alieri
Impact of the erase algorithms on flash memory lifetime
This paper presents a comparative study on the impact of the erase algorithm on flash memory lifetime, to demonstrate how the reduction of overall stress, suffered by memories, will increase their lifetime, thanks to a smart management of erase operations. To this purpose a fixed erase voltage, equal to the maximum value and the maximum time-window, was taken as the reference test; while an algorithm with adaptive voltage levels and the same overall time-window was designed and implemented in order to compare their experimental results. This study was carried out by using an innovative Automated Test Equipment, named Portable-ATE, tailored for Memory Test Chip and designed for performance e…
Performance evaluation of non volatile memories with a low cost and portable automatic test equipment
This paper presents a versatile and portable test equipment, called portable ATE for research and development of non-volatile memories functionalities. The system is based on STM32-NUCLEO assembled with a custom designed daughter board, in order to host non-volatile memories test-chips, to manage the needed power supplies and generate suitable signals stimuli for correct operations. The system is controlled and programmed by a personal computer, via USB interface. In particular the system can perform: memory reading, writing and erasing, with settings flexibility on time and voltage levels; Electrical Stress Tests (Drain, Gate and Bulk Stress); Cycling Tests; debugging algorithms (erase or …