0000000000240200

AUTHOR

Břetislav ŠMíd

0000-0002-8355-1291

showing 1 related works from this author

In-situ electrochemical atomic force microscopy study of aging of magnetron sputtered Pt-Co nanoalloy thin films during accelerated degradation test

2016

Abstract A Pt-Co nanoalloy thin film catalyst was prepared by using simultaneous magnetron sputtering of Pt and Co. The catalyst was characterized during accelerated degradation test using in-situ electrochemical atomic force microscopy complemented with ex-situ techniques such as energy dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy and synchrotron radiation photoelectron spectroscopy. The combined results gave the full step-by-step picture of the catalyst behavior during the aging test.

Materials scienceGeneral Chemical EngineeringAnalytical chemistry02 engineering and technologySputter deposition010402 general chemistry021001 nanoscience & nanotechnologyElectrochemistry01 natural sciences0104 chemical sciencesCatalysisX-ray photoelectron spectroscopyCavity magnetronElectrochemistryThin filmCyclic voltammetry0210 nano-technologySpectroscopyElectrochimica Acta
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