6533b7d4fe1ef96bd12630e4
RESEARCH PRODUCT
In-situ electrochemical atomic force microscopy study of aging of magnetron sputtered Pt-Co nanoalloy thin films during accelerated degradation test
Tomáš SkálaRoman FialaNataliya TsudJaroslava LavkovaJaroslava LavkovaMichal VáclavůIva MatolínováMykhailo VorokhtaBřetislav ŠMídIvan KhalakhanVladimír Matolínsubject
Materials scienceGeneral Chemical EngineeringAnalytical chemistry02 engineering and technologySputter deposition010402 general chemistry021001 nanoscience & nanotechnologyElectrochemistry01 natural sciences0104 chemical sciencesCatalysisX-ray photoelectron spectroscopyCavity magnetronElectrochemistryThin filmCyclic voltammetry0210 nano-technologySpectroscopydescription
Abstract A Pt-Co nanoalloy thin film catalyst was prepared by using simultaneous magnetron sputtering of Pt and Co. The catalyst was characterized during accelerated degradation test using in-situ electrochemical atomic force microscopy complemented with ex-situ techniques such as energy dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy and synchrotron radiation photoelectron spectroscopy. The combined results gave the full step-by-step picture of the catalyst behavior during the aging test.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2016-09-01 | Electrochimica Acta |