0000000000261619
AUTHOR
Francisco J. Ager
Characterization of alpha sources prepared by direct evaporation using Rutherford backscattering spectrometry
Abstract Standardization of solutions containing alpha emitting nuclides by direct evaporation onto metal supports is a widely used technique due to its simplicity in providing good quantitative results. In order to avoid inhomogeneity in the deposition surface, polished stainless steel disks and a spreading agent are generally used. These sources are usually measured by alpha spectrometry using passivated implanted silicon detectors. The resolution of the source is a measure of the thickness and homogeneity of the evaporated layer. Rutherford backscattering of He+ and H+ was here used to measure directly this thickness and homogeneity. The results were in agreement with semiconductor detec…
Ion beam analysis and alpha spectrometry of sources electrodeposited on several backings
Abstract Alpha sources of several activities were prepared by electrodeposition of natural uranium onto four different backings: stainless steel, Ni, Mo and Ti. The influence of the activity, the type of backing, and the process of heating the source on the energy resolution of the spectra were investigated using alpha spectrometry and Rutherford Backscattering Spectrometry (RBS) techniques. Diffusion profiles of the radioactive deposits in the backings were obtained from RBS and related to the results using alpha spectrometry
Multi-technique characterization of gold electroplating on silver substrates for cultural heritage applications
Proceedings of the 12th European Conference on Accelerators in Applied Research and Technology (ECAART12).-- et al.
Reconsidering the accuracy of X-ray fluorescence and ion beam based methods when used to measure the thickness of ancient gildings
Since at least 5000 years ago, gilding techniques have been used for decoration purposes or to make artefacts appear as made of solid gold. Investigation of ancient gildings inevitably requires measuring their thickness, which is usually done either through the observation of cross-sections or by methods such as Rutherford backscattering spectroscopy, particle-induced X-ray emission and X-ray fluorescence. Whereas the former method requires sampling, the latter ones are non-invasive and therefore preferable. These non-invasive methods, however, measure the number of atoms per unit area, which can be converted into thickness only if the density is known. So far this has not been considered a…