Characterization of defect density states in MoOx for c-Si solar cell applications

Layers of MoOx have been deposited by thermal evaporation followed by post-deposition annealing (PDA). The density of states (DOS) distributions of the MoOx films were extracted deconvoluting the absorption spectra, measured by a phothermal deflection spectroscopy setup, including the small polaron contribution. Results revealed a sub-band defect distribution centered 1.1 eV below the conduction band; the amplitude of this distribution was found to increase with PDA temperature and film thickness.

Thin-Film Photovoltaics 2014

The interest toward alternative energy sources to fossil fuels (still the most convenient in terms of efficiency and cost) is current. Initiatives that seek to convert wind, geothermal energy, hydropower, marine, solar thermal energy, and photovoltaics or derived from biomass energy into other forms continue to involve several research groups. For example, the transfer from solar energy into electricity, which in turn can be used for water splitting and for the subsequent production of hydrogen, seems a major challenge to provide a sustainable contribution to the “Earth system” together with the realization of devices having high conversion efficiencies, low environmental impact, and low pr…

Thin-film photovoltaics 2014 (Editorial)