0000000000414428
AUTHOR
Ali Mohammadzadeh
showing 5 related works from this author
Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs—Methodology for Radiation Hardness Assurance
2012
A methodology for power MOSFET radiation hardness assurance is proposed. It is based on the statistical analysis of destructive events, such as gate oxide rupture. Examples of failure rate calculations are performed.
High-Energy Electron-Induced SEUs and Jovian Environment Impact
2017
We present experimental evidence of electron-induced upsets in a reference European Space Agency (ESA) single event upset (SEU) monitor, induced by a 200-MeV electron beam at the Very energetic Electronic facility for Space Planetary Exploration in harsh Radiation environments facility at CERN. Comparison of experimental cross sections and simulated cross sections is shown and the differences are analyzed. Possible secondary contributions to the upset rate by neutrons, flash effects, and cumulative dose effects are discussed, showing that electronuclear reactions are the expected SEU mechanism. The ESA Jupiter Icy Moons Explorer mission, to be launched in 2022, presents a challenging radiat…
SEE on Different Layers of Stacked-SRAMs
2015
International audience; This paper presents heavy-ion and proton radiation test results of a 90 nm COTS SRAM with stacked structure. Radiation tests were made using high penetration heavy-ion cocktails at the HIF (Belgium) and at RADEF (Finland) as well as low energy protons at RADEF. The heavy-ion SEU cross-section showed an unusual profile with a peak at the lowest LET (heavy-ion with the highest penetration range). The discrepancy is due to the fact that the SRAM is constituted of two vertically stacked dice. The impact of proton testing on the response of both stacked dice is presented. The results are discussed and the SEU cross-sections of the upper and lower layers are compared. The …
Influence of beam conditions and energy for SEE testing
2012
GANIL/Applications industrielles; The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles: SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results. Testing to high fluence levels is required to detect rare events. This increases the probability of nuclear interactions. This is typically the case for power MOSFETs, which are tested at high fluences for single event burnout or gate rupture detection, and for single-event-upset (SEU) measurement in SRAMs below the direct ionization threshold. Differences between various test conditions (…
Automatic Relative Radiometric Normalization of Bi-Temporal Satellite Images Using a Coarse-to-Fine Pseudo-Invariant Features Selection and Fuzzy Int…
2022
Relative radiometric normalization (RRN) is important for pre-processing and analyzing multitemporal remote sensing (RS) images. Multitemporal RS images usually include different land use/land cover (LULC) types; therefore, considering an identical linear relationship during RRN modeling may result in potential errors in the RRN results. To resolve this issue, we proposed a new automatic RRN technique that efficiently selects the clustered pseudo-invariant features (PIFs) through a coarse-to-fine strategy and uses them in a fusion-based RRN modeling approach. In the coarse stage, an efficient difference index was first generated from the down-sampled reference and target images by combining…