0000000000626128
AUTHOR
Jan Renger
showing 3 related works from this author
Dielectric-loaded surface plasmon polariton waveguides: Figures of merit and mode characterization by image and Fourier plane leakage microscopy
2008
International audience; Waveguiding of surface plasmon polaritons by dielectric-loaded metal structures is studied in detail by combining numerical simulations and leakage radiation microscopy. These types of waveguides are first numerically investigated using the effective index model and the differential method. We analyzed systematically the influence of the ridge width and thickness of the waveguide on the properties of the surface plasmon guided modes. In particular we investigated the confinement factor of the modes and their associated propagation lengths. These two parameters can be optimized by adjusting the thickness of the dielectric layer. Waveguides loaded with thick and thin d…
Performance of electro-optical plasmonic ring resonators at telecom wavelengths
2012
International audience; In this work we report on the characteristics of an electro-optical dielectric-loaded surface plasmon polariton waveguide ring resonator. By doping the dielectric host matrix with an electro-optical material and designing an appropriate set of planar electrodes, we measured a 16% relative change of transmission upon application of a controlled electric field. We have analyzed the temporal response of the device and conclude that electrostriction of the host matrix is playing a dominating role in the transmission response.
Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy
2007
International audience; The guiding properties of polymer waveguides on a thin gold film are investigated in the optical regime. The details of propagation in the waveguides are studied simultaneously in the object and Fourier planes, providing direct measurement of both the real and imaginary parts of the effective index of the guided mode. A fair agreement between theoretical analysis provided by the differential method and experimental leakage radiation microscopy data is shown. All these tools bring valuable information for designing and understanding such devices. (C) 2007 American Institute of Physics.