6533b870fe1ef96bd12d0649

RESEARCH PRODUCT

Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy

S. MassenotMaría Ujué GonzálezRomain QuidantAlexandre BouhelierJan RengerJonathan GrandidierAlain DereuxJ.-c. WeeberLaurent MarkeyG. Colas Des Francs

subject

Materials sciencePhysics and Astronomy (miscellaneous)Physics::Optics02 engineering and technology01 natural sciencesWaveguide (optics)law.invention010309 opticssymbols.namesakeOpticsOptical microscopelaw0103 physical sciencesMicroscopySCATTERING[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics][ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics]business.industryScatteringPlane (geometry)SURFACE-PLASMONSSurface plasmon021001 nanoscience & nanotechnologyCharacterization (materials science)Fourier transformsymbols[SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicOptoelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / PhotonicOPTICS0210 nano-technologybusiness

description

International audience; The guiding properties of polymer waveguides on a thin gold film are investigated in the optical regime. The details of propagation in the waveguides are studied simultaneously in the object and Fourier planes, providing direct measurement of both the real and imaginary parts of the effective index of the guided mode. A fair agreement between theoretical analysis provided by the differential method and experimental leakage radiation microscopy data is shown. All these tools bring valuable information for designing and understanding such devices. (C) 2007 American Institute of Physics.

10.1063/1.2824840https://hal.science/hal-00472400