0000000000644568

AUTHOR

Rudy Ferraro

showing 2 related works from this author

Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

2021

International audience; Functional verification schemes at a level different from component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Despite the promising potential, system-level radiation testing can be applied to the functional verification of systems under restricted intrinsic boundaries. Most of them are related to the use of hadrons as opposed to heavy ions. Hadrons are preferred for the irradiation of any bulky system, in general, because of their deeper penetration capabilities. General guidelines about the test preparation and procedure for a high-level radiation test ar…

Small satelllitessmall satellitesComputer scienceRadiation effects02 engineering and technologytest methodology01 natural sciencesSpace missionsSpace explorationsystem-level testing0202 electrical engineering electronic engineering information engineeringRadiation hardeningTechnik [600]Reliability (statistics)avaruustekniikka[PHYS]Physics [physics]protonselektroniikkalaitteetrisk acceptance[PHYS.PHYS.PHYS-SPACE-PH]Physics [physics]/Physics [physics]/Space Physics [physics.space-ph]Commercial off-the-shelf (COTS)Test (assessment)facilitiesPerformance evaluationTotal ionizing doseSystem verificationtestmethodologyNuclear and High Energy Physicstotal ionizing dose (TID)0103 physical scienceselektroniikkaRadiation hardening (electronics)Electrical and Electronic Engineeringsingle-event effect (SEE)Functional verification010308 nuclear & particles physics600: Technikneutrons020206 networking & telecommunicationsTest methodSystem level testingReliability engineering[SPI.TRON]Engineering Sciences [physics]/ElectronicsNuclear Energy and EngineeringtestausmenetelmätsäteilyfysiikkaOrbit (dynamics)radiation hardness assurancejärjestelmätddc:600
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A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

2015

A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.

Computer sciencebitmap slicingParallel computingHardware_PERFORMANCEANDRELIABILITYRadiationSlicingUpsetElectronic mailSuperposition principleStatic random-access memoryMemoriesstatic testNuclear Experimentdynamic testta114ta213computer.file_formatSRAMBitmap[SPI.TRON]Engineering Sciences [physics]/ElectronicsMultiple Cell Upset (MCU)MCUSERBitmapradiation testevent accumulationSingle Event Upset (SEU)AlgorithmcomputerSEUTest data
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