0000000000648486
AUTHOR
Aurélien Besnard
showing 3 related works from this author
Curvature radius measurement by optical profiler and determination of the residual stress in thin films
2019
Abstract The Stoney formula, based on the measurement of the substrate curvature, is often used for the determination of the thin films' residual stress. In this study, titanium nitride coatings were deposited by DC reactive magnetron sputtering on silicon substrates. An optical profiler was used to determine the curvature of the surface before and after coating. Two radii were then obtained, along the principal perpendicular directions of the surface curvature. A simple and efficient method to determine the experimental error on the stress calculation was developed taking into account the film thickness dispersion and the radii dispersion. Using constant deposition parameters, some samples…
Rapid response of a long-lived species to improved water and grazing management: the case of the European pond turtle (Emys orbicularis) in the Camar…
2014
7 pages; International audience; Among human activities, the effect of habitat management by grazing on population viability is ambiguous. Indeed, beneficial effects of grazing are expected by maintaining open meadows, but overgrazing is supposed to increase mortality by trampling. Grazing has been shown to negatively impact the survival of European pond turtle (Emys orbicularis) in the Camargue. Consequently, a new management plan was defined. We investigated the consequences of this management using capture-recapture methods to estimate variations of population sizes in this managed site and a control site over a 17 years period. Results show an increase of the number of adults and juveni…
Three steps strategy for thin film growth simulation: example of Cr/CrNx multlayers
2013
Three steps strategy for thin film growth simulation: example of Cr/CrNx multlayers