0000000000684509
AUTHOR
D. Tonneau
<title>Scanning probe microscopy of nanocrystalline iridium oxide thin films</title>
Structural investigations of nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique were performed by scanning probe microscopy (SPM). SPM studies, using both atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), indicate that the thin films are composed of grains with a size of about 20-50 nm. Fine crystallinity and small RMS microroughness of the films, being well below 2 nm, make iridium oxide thin films promising candidates for nanolithographic applications. The possibility to perform nanolithograhpic processes at a scale of less than 150 nm was successfully examined in AFM and STM modes.© (2003) COPYRIGHT SPIE--The International Societ…
Ultracompact x-ray dosimeter based on scintillators coupled to a nano-optical antenna
International audience; We show that nano-optical antennas are capable of controlling the luminescence induced by the absorption of x rays into matter. The x-ray-excited luminescence from a tiny scintillation cluster coupled to a horn nano-optical antenna is highly directed and determined by the antenna’s geometrical parameters. Directionality is sufficiently high to efficiently outcouple the x-ray-excited luminescence to a narrow single-mode optical fiber, thus enabling ultracompact fiber-integrated x-ray sensors. Our nano-optically driven approach offers the possibility of x-ray profiling and dosimetry in ultra-confined environments, opening up new avenues in the fields of x-ray imaging, …