0000000000728958
AUTHOR
David De Andrés
Fault Emulation for Dependability Evaluation of VLSI Systems
Advances in semiconductor technologies are greatly increasing the likelihood of fault occurrence in deep-submicrometer manufactured VLSI systems. The dependability assessment of VLSI critical systems is a hot topic that requires further research. Field-programmable gate arrays (FPGAs) have been recently pro posed as a means for speeding-up the fault injection process in VLSI systems models (fault emulation) and for reducing the cost of fixing any error due to their applicability in the first steps of the development cycle. However, only a reduced set of fault models, mainly stuck-at and bit-flip, have been considered in fault emulation approaches. This paper describes the procedures to inje…
Run-Time Reconfiguration for Emulating Transient Faults in VLSI Systems
Advances in circuitry integration increase the probability of occurrence of transient faults in VLSI systems. A confident use of these systems requires the study of their behaviour in the presence of such faults. This study can be conducted using model-based fault injection techniques. In that context, field-programmable gate arrays (FPGAs) offer a great promise by enabling those techniques to execute models faster. This paper focuses on how run-time reconfiguration techniques can be used for emulating the occurrence of transient faults in VLSI models. Although the use of FPGAs for that purpose has been restricted so far to the well-known bit-flip fault model, recent studies in fault repres…