0000000000800409

AUTHOR

Gerhard Betz

showing 3 related works from this author

Round Robin computer simulation of ejection probability in sputtering

1989

Abstract We have studied the ejection of a copper atom through a planar copper surface as a function of recoil velocity and depth of origin. Results were obtained from six molecular dynamics codes, four binary collision lattice simulation codes, and eight Monte Carlo codes. Most results were found with a Born-Mayer interaction potential between the atoms with Gibson 2 parameters and a planar surface barrier, but variations on this standard were allowed for, as well as differences in the adopted cutoff radius for the interaction potential, electronic stopping, and target temperature. Large differences were found between the predictions of the various codes, but the cause of these differences…

Nuclear and High Energy PhysicsChemistryBinary number02 engineering and technology021001 nanoscience & nanotechnologyCollision01 natural sciencesComputational physicsMolecular dynamicsPlanarSputteringLattice (order)0103 physical sciencesRecoil velocityCutoffStatistical physics010306 general physics0210 nano-technologyInstrumentation
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Crystallographic analysis of extended defects in diamond-type crystals

2005

Abstract To investigate irradiation-induced Si amorphization during its initial stages, we have performed a classical molecular-dynamics (MD) calculation for the case of self-irradiation by 5 keV ions at a low temperature of 100 K. We examined the geometry of self-interstitial atom (SIA) clusters using the pixel mapping (PM) method, on the output data of MD calculations. Perfect crystalline silicon (c-Si) is amorphized by self-irradiation, and we observe that many SIA are produced. During sequential self-irradiation, the most frequently observed species were isolated SIA, i.e. I1 (monomer). The fractions of SIA clusters decreased as I2 (dimer), I3 (trimer), and I4 (tetramer) clusters, respe…

Nuclear and High Energy PhysicsMolecular dynamicschemistry.chemical_compoundCrystallographyDiamond typechemistryTetramerDimerAtomTrimerCrystalline siliconInstrumentationIonNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Detection of planar defects caused by ion irradiation in Si using molecular dynamics

2007

We have analyzed the evolution of defects caused by self-irradiation of crystalline silicon. A classical molecular dynamics simulation was followed by defect analysis using the Pixel Mapping (PM) method. The PM identified {311} planar defects and long-chain structures of the so-called interstitial chains following low energy (1 keV) ion impact. The areal density obtained from simulation of self-interstitial atoms was about two thirds of that of experiments reported in the literature [Jpn. J. Appl. Phys. 30 (1991) L639], while the atomic configuration on respective planes agreed exactly.

Materials scienceIon beamPixel mappingSurfaces and InterfacesGeneral ChemistryCondensed Matter PhysicsSurfaces Coatings and FilmsIonMolecular dynamicsPlanarMaterials ChemistryIrradiationCrystalline siliconArea densityAtomic physicsSurface and Coatings Technology
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