0000000000824388
AUTHOR
Carlos Ziebert
Processing and properties of nanocrystalline Pb(Sc0.5Ta0.5)O3, Pb(Sc0.5Nb0.5)O3, Pb(Mg1/3Nb2/3)O3and Pb0.76Ca0.24TiO3films and ferroelectric/ relaxor superlattices
Abstract Thin films of relaxor materials, namely Pb(Sc0.5Ta0.5)O3 (PST), Pb(Sc0.5Nb0.5)O3 (PSN) and Pb(Mg1/3Nb2/3)O3 (PMN), and of Pb0.76Ca0.24TiO3 (PTC), which is a classical ferroelectric as bulk material, have been produced to examine whether nanocrystalline relaxor materials show influences in their properties if their grain size is reduced to dimensions known from their nanodomains and to investigate effects in a superlattice of nanocrystalline ferroelectric and relaxor films. At first amorphous films of the different materials were deposited onto a Ti/Pt coated Silicon (100) wafer by reactive rf-sputtering. Different grain sizes could be prepared by a controlled annealing process. The…
Grain-size-induced relaxor properties in nanocrystalline perovskite films
Thin films of ${\mathrm{Pb}}_{0.76}{\mathrm{Ca}}_{0.24}{\mathrm{TiO}}_{3}$ (PTC), which is a classical ferroelectric as a bulk material and of the relaxor material $\mathrm{Pb}({\mathrm{Sc}}_{0.5}{\mathrm{Nb}}_{0.5}){\mathrm{O}}_{3}$, have been produced to find out whether nanocrystalline ferroelectric films show a grain-size-induced relaxor behavior. Amorphous films were deposited onto a $\mathrm{Ti}∕\mathrm{Pt}$ coated silicon (100) wafer by reactive $\text{rf}$ sputtering. Different grain sizes were prepared by a controlled annealing process and they were determined by profile analysis of x-ray diffraction spectra. Temperature dependent Raman spectroscopy was used to look for phase trans…
Processing and properties of nanocrystalline Pb(Sc0.5Ta0.5)O3, Pb(Sc0.5nb0.5)O3 and Pb(Mg1/3Nb2/3)O3 films produced by RF-sputtering from ceramic targets
Abstract Nanocrystalline thin films of different relaxor materials, namely Pb(Sc0.5Ta0.5)O3 (PST), Pb(Sc0.5Nb0.5)O3(PSN), Pb(Mg1/3Nb2/3)O3(PMN) have been produced by RF-sputtering to investigate whether it will affect their dielectric properties if their grain size is reduced to the dimensions known from their nanodomains. The XRD shows that the amorphous film crystallizes in pyrochlore structure at lower temperatures and short times. Annealing at higher temperatures and far longer time intervals leads to an increasing amount of perovskite phase with a grain size in the nanometer range. These results including dielectric measurements will be presented and discussed.