6533b873fe1ef96bd12d4bb6

RESEARCH PRODUCT

Processing and properties of nanocrystalline Pb(Sc0.5Ta0.5)O3, Pb(Sc0.5nb0.5)O3 and Pb(Mg1/3Nb2/3)O3 films produced by RF-sputtering from ceramic targets

Carlos ZiebertJan K. KrügerK.-h. EhsesH. SchmittAndris Sternberg

subject

Materials scienceAnnealing (metallurgy)Analytical chemistryPyrochloreMineralogyDielectricengineering.materialCondensed Matter PhysicsNanocrystalline materialGrain sizeElectronic Optical and Magnetic MaterialsAmorphous solidControl and Systems EngineeringSputteringvisual_artMaterials ChemistryCeramics and Compositesvisual_art.visual_art_mediumengineeringCeramicElectrical and Electronic Engineering

description

Abstract Nanocrystalline thin films of different relaxor materials, namely Pb(Sc0.5Ta0.5)O3 (PST), Pb(Sc0.5Nb0.5)O3(PSN), Pb(Mg1/3Nb2/3)O3(PMN) have been produced by RF-sputtering to investigate whether it will affect their dielectric properties if their grain size is reduced to the dimensions known from their nanodomains. The XRD shows that the amorphous film crystallizes in pyrochlore structure at lower temperatures and short times. Annealing at higher temperatures and far longer time intervals leads to an increasing amount of perovskite phase with a grain size in the nanometer range. These results including dielectric measurements will be presented and discussed.

yearjournalcountryeditionlanguage
2000-11-01Integrated Ferroelectrics
https://doi.org/10.1080/10584580008215652