Blendensysteme für Streulichtphotometer

The geometrical arrangement of slits in the secondary beam of light scattering photometers has been investigated. The hitherto applied configuration of slits, vertically fixed on the secondary beam, requires a volume correction-sinϑ-for the determination of the angle-dependent scattered intensity. Arrangements of slits with varying width which depends on the angle of observation ϑ are proposed. They avoide the volume correction, or render the scattering volume independent of ϑ, and at the same time increase the measuring accuracy.