6533b858fe1ef96bd12b61d3
RESEARCH PRODUCT
Blendensysteme für Streulichtphotometer
G. MeyerhoffA. Burmeistersubject
PhysicsScatteringbusiness.industryAstrophysics::Instrumentation and Methods for AstrophysicsGeneral EngineeringGeneral ChemistryPhotometerVolume correctionLight scatteringlaw.inventionOpticsVolume (thermodynamics)lawLight beamGeneral Materials SciencebusinessIntensity (heat transfer)Beam (structure)description
The geometrical arrangement of slits in the secondary beam of light scattering photometers has been investigated. The hitherto applied configuration of slits, vertically fixed on the secondary beam, requires a volume correction-sinϑ-for the determination of the angle-dependent scattered intensity. Arrangements of slits with varying width which depends on the angle of observation ϑ are proposed. They avoide the volume correction, or render the scattering volume independent of ϑ, and at the same time increase the measuring accuracy.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1973-05-01 | Applied physics |