6533b7d3fe1ef96bd1260995
RESEARCH PRODUCT
Electrical Characterization of CdTe pixel detectors with Al Schottky anode
A.a. TurturiciGaetano GerardiLeonardo AbbeneFabio Principatosubject
PhysicspolarizationNuclear and High Energy PhysicsSchottky contactbusiness.industrySchottky barrierSettore FIS/01 - Fisica SperimentaleSchottky diodeCdTeThermal conductionSpace chargeCadmium telluride photovoltaicsSettore FIS/07 - Fisica Applicata(Beni Culturali Ambientali Biol.e Medicin)Settore FIS/03 - Fisica Della MateriaAnodeX-ray and gamma ray spectroscopypixel detectorOptoelectronicsPolarization (electrochemistry)businessCdTe; Schottky contacts; polarization; pixel detectors; X-ray and gamma ray spectroscopyInstrumentationVoltagedescription
Abstract Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution X-ray spectroscopic imaging, even though they suffer from bias-induced time instability (polarization). In this work, we present the results of the electrical characterization of a (4×4) pixelated Schottky Al/p-CdTe/Pt detector. Current–voltage ( I–V ) characteristics and current transients were investigated at different temperatures. The results show deep levels that play a dominant role in the charge transport mechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) both under forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe contact was estimated by using the thermionic-field emission model at low reverse bias voltages. Activation energy of the deep levels was measured through the analysis of the reverse current transients at different temperatures. Finally, we employed an analytical method to determine the density and the energy distribution of the traps from SCLC current–voltage characteristics.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2014-11-01 |