6533b7d3fe1ef96bd12613c1
RESEARCH PRODUCT
Single crystal EXAFS at high pressure
Alain PolianAlfredo SeguraAlfonso San-miguelJulio Pellicer-porresJ. P. ItiéMichel Gauthiersubject
[SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]Materials science[SDU.STU.GP]Sciences of the Universe [physics]/Earth Sciences/Geophysics [physics.geo-ph]business.industryLinear polarizationSynchrotron radiation02 engineering and technologyUndulator021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesDiamond anvil cellCharacterization (materials science)OpticsSurface-extended X-ray absorption fine structure0103 physical sciences[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci][PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]010306 general physics0210 nano-technologybusinessSingle crystalComputingMilieux_MISCELLANEOUSBeam (structure)description
Abstract We present a new technique for structure characterization under high pressure conditions. The use of an undulator beam of the third-generation ESRF source of synchrotron radiation has enabled the first single crystal EXAFS experiments at high pressure using a diamond anvil cell as pressure generator. Taking advantage of the linear polarization of X-rays the technique becomes an orientation-selective probe of the local structure of materials. We describe the principle of the technique and some applications.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2000-09-01 | High Pressure Research |