6533b7d5fe1ef96bd1263af8
RESEARCH PRODUCT
THREE-DIMENSIONAL INTEGRAL MICROSCOPY WITH ENHANCED RESOLUTION AND DEPTH OF FIELD
Emilio Sánchez-ortigaJorge Sola-pikabeaManuel Martínez-corralAnabel LlavadorGenaro Saavedrasubject
OpticsMaterials sciencebusiness.industryMultifocal plane microscopyLight sheet fluorescence microscopyResolution (electron density)MicroscopyScanning confocal electron microscopyDigital holographic microscopyDepth of fieldbusinessImage resolutiondescription
In this contribution we explain two new techniques developed by our group, which permit to increase the two-dimensional spatial resolution of the computed depth images in integral microscopy.
year | journal | country | edition | language |
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2016-01-01 | Imaging and Applied Optics 2016 |