6533b7d5fe1ef96bd126472c
RESEARCH PRODUCT
Tunable optical sectioning in confocal microscopy by use of symmetrical defocusing and apodization
Carlos J. Zapata-rodríguezManuel Martínez-corralMarek KowalczykPedro Andréssubject
Materials scienceMicroscopeOptical sectioningbusiness.industryMaterials Science (miscellaneous)ConfocalScanning confocal electron microscopyPhysics::OpticsIndustrial and Manufacturing Engineeringlaw.inventionOpticsCardinal pointApodizationlawConfocal microscopyReflection (physics)Business and International Managementbusinessdescription
We present two novel optical methods to achieve a significative improvement in the optical-sectioning capacity of confocal scanning microscopes. The techniques, whose real power is the simplicity with which they can be implemented, consist of a suitable combination of symmetrical defocusing with two different manners of apodizing both parts of the confocal architecture. It is shown that the proposed techniques are useful in both the bright-field and the fluorescence modes and for reflection and transmission geometries.
year | journal | country | edition | language |
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2008-02-28 | Applied Optics |