6533b7d6fe1ef96bd12659a7

RESEARCH PRODUCT

<title>Holographic recording of subwavelength structures in amorphous chalcogenide thin films</title>

subject

description

Holographic recording of surface-relief and refiactive-index-modulated gratings with a period ranging from 0.15 to 1 μm in thin amorphous chalcogenide films of As-S-Se and As2S3 is studied. The profile of the surface-relief gratings is measured by atomic force microscopy. By structuring the As-S-Se films with the subwavelength-period surface-relief gratings their reflectivity is decreased from 25-30% to less than 2%. In the refractive-index-modulated As2S3 films polarization effects are revealed. It is shown that the angular selectivity of the holographic recording in amorphous chalcogenide thin films can be substantially improved by decreasing the grating period.© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.