6533b7d7fe1ef96bd126834c

RESEARCH PRODUCT

Risk Assessment of Electron Induced SEE during the JUICE Mission

C. Boatella PoloAthina VarotsouRobert EcoffetN. ChatryL. SalvyFrancoise BezerraG. AugustinMaris TaliN. SukhaseumB. Vandevelde

subject

010302 applied physicsPhysicsWork (thermodynamics)High energyProton010308 nuclear & particles physicsElectron01 natural sciencesIonNuclear physicsIonization0103 physical sciencesElectronicsGeocentric orbit

description

The SEE sensitivity of electronic devices to high energy electrons has been put in evidence experimentally. Several ground experiments have shown that electron induced SEE could occur in recent technologies. In the case of the JUICE mission, the expected electron environment is harsher than for Earth orbits. The impact of such electron fluxes on the embedded electronics was assessed in this work. The study focused on SRAM memories SEU sensitivity. Three different device references were tested under electrons, as well as under protons and heavy ions. The electron and the low energy proton direct ionization contributions to the total SEU rate have been studied in more detail.

yearjournalcountryeditionlanguage
2018-09-012018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
https://doi.org/10.1109/radecs45761.2018.9328721