6533b7d8fe1ef96bd126a29d
RESEARCH PRODUCT
Design for a high resolution electron energy loss microscope.
A. LafosseMarian MankosGerd SchönhenseL. AmiaudDaniel ComparatNicholas BarrettKhashayar ShadmanRaphaël HahnYan J. PicardO. Fedchenkosubject
MicroscopeMaterials scienceEELSPhonon02 engineering and technologyElectron01 natural scienceslaw.inventionOpticslawsurface imaging0103 physical sciencesMicroscopy[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]InstrumentationImage resolutionLEEM010302 applied physicsSpectrometer[PHYS.PHYS.PHYS-ATOM-PH]Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph]business.industry021001 nanoscience & nanotechnologyLaserAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsExcited state0210 nano-technologybusinessdescription
International audience; An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, noncontact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2019-01-01 | Ultramicroscopy |