6533b7dbfe1ef96bd126f7b4
RESEARCH PRODUCT
Environmental chamber for an atomic force microscope.
M. AhlskogK. RanttilaJ. Lievonensubject
Materials sciencebusiness.industryAtomic force microscopyEnvironmental chamberUltra-high vacuumchemistry.chemical_elementHumidityHumidityConductive atomic force microscopyMicroscopy Atomic Forcelaw.inventionOpticsPressure measurementchemistryAluminiumlawPressureGasesComposite materialbusinessInstrumentationNon-contact atomic force microscopyComputer Science::DatabasesAluminumdescription
A commercial atomic force microscope (AFM), originally designed for operation in ambient conditions, was placed inside a compact aluminum chamber, which can be pumped down to high vacuum levels or filled with a desired gaseous atmosphere, including humidity, up to normal pressure. The design of this environmental AFM is such that minimal intrusion is made to the original setup, which can be restored easily. The performance inside the environmental chamber is similar to the original version.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2007-05-05 | The Review of scientific instruments |