6533b81ffe1ef96bd1277982

RESEARCH PRODUCT

Processing, basic characterization and standard dielectric measurements on PLZT x/65/35 (2≤x≤13) ceramics

Krzysztof PytelM. LivinshAndris SternbergJan Suchanicz

subject

010302 applied physicsPermittivityMaterials science02 engineering and technologyDielectric021001 nanoscience & nanotechnologyCondensed Matter PhysicsUniaxial pressure01 natural sciencesElectronic Optical and Magnetic MaterialsCharacterization (materials science)IonStress (mechanics)visual_art0103 physical sciencesPeak intensityvisual_art.visual_art_mediumCeramicComposite material0210 nano-technology

description

ABSTRACTThe influence of external stress (0-800bar) on the dielectric properties of PLZT x/65/35 (2≤x≤13) ceramics was investigated. Applying uniaxial pressure leads to a change in the peak intensity of the electric permittivity (ϵ), of its frequency dispersion as well as in the dielectric hysteresis. The peak intensity of ϵ becomes broader and shifts to lower temperatures for PLZT x/65/35 with x = 2, 4, 6, 7, 9.75, 10, 11 and 13, with increasing pressure, on heating. It was concluded that applying uniaxial pressure induces an increase of Tm, and thus has similar effects as the increase of the Ti ion concentration in the PZT system. Results based on nanoregion switching processes under combined electromechanical loading were interpreted. Surveys clearly demonstrated that applied stress has a significant influence on the dielectric properties of PLZT ceramics.

yearjournalcountryeditionlanguage
2016-05-31Ferroelectrics
https://doi.org/10.1080/00150193.2016.1171644