6533b820fe1ef96bd127a24e

RESEARCH PRODUCT

Photon Scanning Tunneling Microscopy and Reflection Scanning Microscopy

J. P. GoudonnetN. CerreTrinidad L. FerrellL. SalomonF. De Fornel

subject

Total internal reflectionMaterials sciencebusiness.industryScanning confocal electron microscopyPhysics::OpticsScanning capacitance microscopylaw.inventionScanning probe microscopyOpticslawMicroscopyPrismScanning tunneling microscopebusinessVibrational analysis with scanning probe microscopy

description

The Photon Scanning Tunneling Microscope (PSTM) is the photon analogue to the Electron Scanning Tunneling Microscope (ESTM). It uses the evanescent field due to the total internal reflection (TIR) of a light beam in a prism modulated by a sample attached to the prism. The exponential decay of the evanescent field is characterized by the penetration depth dp and depends on the angle of incidence θ, the wavelength and polarization of the incident beam. Changes in intensity are monitored by a probe tip scanned over the surface, and the data are processed to generate an image of the sample. Images produced by a prototype instrument are shown to have a vertical resolution of about 3 A and a lateral resolution of about 100 A.

yearjournalcountryeditionlanguage
1991-01-01
https://doi.org/10.1007/978-3-642-84494-2_28