6533b825fe1ef96bd1283090
RESEARCH PRODUCT
Scanning electron microscopy study of twins in ZnSe single crystals grown by solid-phase recrystallization
V. MuñozJavier PiquerasPaloma FernándezAna Urbietasubject
Materials sciencebusiness.industryMechanical EngineeringAnalytical chemistryRecrystallization (metallurgy)CathodoluminescenceCondensed Matter PhysicsWavelengthOpticsMicrocrystallineMechanics of MaterialsGeneral Materials SciencebusinessScanning electron microscopy studyStoichiometryRecombinationdescription
ZnSe single crystals were grown from n-type microcrystalline boules by a solid phase recrystallization (SPR) method. During SPR, twinned regions appear with different electronic recombination properties. The recrystallizations were performed under different atmospheres, Ar or Se, and pressures to investigate the influence of growth conditions on these structural features. Recombination properties were studied by means of cathodoluminescence (CL) and remote-electron beam induced current (REBIC). Wavelength dispersive X-ray (WDX) mappings were also performed to analyze possible differences in stoichiometry related to the presence of extended defects.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-03-01 | Materials Science and Engineering: B |