0000000000589727
AUTHOR
Ana Urbieta
Scanning electron microscopy study of twins in ZnSe single crystals grown by solid-phase recrystallization
ZnSe single crystals were grown from n-type microcrystalline boules by a solid phase recrystallization (SPR) method. During SPR, twinned regions appear with different electronic recombination properties. The recrystallizations were performed under different atmospheres, Ar or Se, and pressures to investigate the influence of growth conditions on these structural features. Recombination properties were studied by means of cathodoluminescence (CL) and remote-electron beam induced current (REBIC). Wavelength dispersive X-ray (WDX) mappings were also performed to analyze possible differences in stoichiometry related to the presence of extended defects.
Scanning electron microscopy characterization of ZnSe single crystals grown by solid-phase recrystallization
ZnSe single crystals were grown from n-type microcrystalline boules by a Solid Phase Recrystallization (SPR) method. The recrystallizations were performed under different atmospheres, Ar or Se, and pressures to investigate the influence of growth conditions on the structural features of the resulting crystals. The samples were mechanically and mechano-chemically polished in a bromine methanol solution and, then, etched in HCl for a short time, before characterization. The homogeneity and the nature of defects in the crystals were studied by Cathodoluminescence (CL) in the scanning electron microscope (SEM). CL measurements show the existence of slip bands in the recrystallized samples, like…