6533b86dfe1ef96bd12c937a
RESEARCH PRODUCT
Scanning electron microscopy characterization of ZnSe single crystals grown by solid-phase recrystallization
Javier PiquerasAna UrbietaPaloma FernándezV. Muñozsubject
BromineMaterials scienceScanning electron microscopeMechanical EngineeringLüders bandchemistry.chemical_elementCrystal growthCathodoluminescenceCondensed Matter PhysicsCrystallographic defectSpectral lineCrystallographyMicrocrystallinechemistryMechanics of MaterialsGeneral Materials Sciencedescription
ZnSe single crystals were grown from n-type microcrystalline boules by a Solid Phase Recrystallization (SPR) method. The recrystallizations were performed under different atmospheres, Ar or Se, and pressures to investigate the influence of growth conditions on the structural features of the resulting crystals. The samples were mechanically and mechano-chemically polished in a bromine methanol solution and, then, etched in HCl for a short time, before characterization. The homogeneity and the nature of defects in the crystals were studied by Cathodoluminescence (CL) in the scanning electron microscope (SEM). CL measurements show the existence of slip bands in the recrystallized samples, likewise CL spectra show that on these samples the dislocation related Y band is enhanced and the emission bands appearing in the 2.0-2.5 eV region depend on the annealing conditions. In addition during SPR, twinned regions appear with different electronic recombination properties.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2000-12-01 | Materials Science and Engineering: B |