6533b826fe1ef96bd1284664
RESEARCH PRODUCT
Real-time measurements of sliding friction and elastic properties of ZnO nanowires inside a scanning electron microscope
Rünno LõhmusSergei VlassovAnts LõhmusBoris PolyakovBoris PolyakovIlmar KinkAlexey E. RomanovLeonid M. Doroginsubject
Materials scienceNanomanipulatorScanning electron microscopeNanowireModulusNanotechnologyGeneral ChemistryBendingTribologyCondensed Matter PhysicsFocused ion beamMaterials ChemistryWaferComposite materialdescription
Abstract A real-time nanomanipulation technique inside a scanning electron microscope (SEM) has been used to investigate the elastic and frictional (tribological) properties of zinc oxide nanowires (NWs). A NW was translated over a surface of an oxidised silicon wafer using a nanomanipulator with a glued atomic-force microscopic tip. The shape of the NW elastically deformed during the translation was used to determine the distributed kinetic friction force. The same NW was then positioned half-suspended on edges of trenches cut by a focused ion beam through a silicon wafer. In order to measure Young’s modulus, the NW was bent by pushing it at the free end with the tip, and the interaction force corresponding to the visually observed bending angle was measured with a quartz tuning fork force sensor.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2011-09-01 | Solid State Communications |