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RESEARCH PRODUCT
Determination of Contact Potential Difference by the Kelvin Probe (Part II) 2. Measurement System by Involving the Composite Bucking Voltage
J. BusenbergsD. MerkulovsO. VilitisMartins Rutkissubject
010302 applied physicsKelvin probe force microscopeMaterials sciencesurface potentialbusiness.industrySystem of measurementPhysicsQC1-999Composite numberGeneral EngineeringGeneral Physics and Astronomy02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesOpticscontact potential differencekelvin probe0103 physical sciences0210 nano-technologybusinessVolta potentialVoltagedescription
Abstract The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2016-12-01 | Latvian Journal of Physics and Technical Sciences |