6533b829fe1ef96bd1289800
RESEARCH PRODUCT
SMILETRAP — Atomic mass measurements with ppb accuracy by using highly charged ions
C. CarlbergH.-j. KlugeG. RouleauR. SchuchH. BorgenstrandG. BollenT. SchwarzR. MannI. BergströmR. JertzJ. SteinF. Söderbergsubject
Nuclear and High Energy PhysicsProtonHydrogenAnalytical chemistrychemistry.chemical_elementCondensed Matter PhysicsPenning trapAtomic and Molecular Physics and OpticsAtomic massIonNeonchemistryCalibrationPhysics::Atomic PhysicsPhysical and Theoretical ChemistryAtomic physicsCarbondescription
In the SMILETRAP facility externally produced highly charged ions are captured in a Penning trap and utilized for high precision measurements of atomic masses. Accuracy tests on a ppb level have been performed, using highly charged carbon, oxygen and neon ions. In all cases hydrogen ions served as a reference for the calibration and monitoring of the magnetic field in the trap. Deviations smaller than 3 ppb from the expected results were found in mass measurements of the16O and20Ne atomic masses. The proton atomic mass, determined from the reference measurements on hydrogen ions, is in good agreement with the accepted value [1]. A direct mass measurement on the86Kr-isotope, using trapped86Kr29+-ions is reported.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1996-12-01 | Hyperfine Interactions |