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RESEARCH PRODUCT
Dielectric properties of reactor irradiated ferroelectric thin films
Harald W. WeberD. V. KulkovAndris SternbergL. CakareL. CakareKarl HumerM. TyuninaM. TyuninaYuri V. TrushinR. Bittnersubject
Materials scienceAnnealing (metallurgy)BolometerAnalytical chemistryDielectricCondensed Matter PhysicsFerroelectricityElectronic Optical and Magnetic Materialslaw.inventionNuclear magnetic resonanceControl and Systems EngineeringlawNeutron fluxMaterials ChemistryCeramics and CompositesAntiferroelectricityIrradiationElectrical and Electronic EngineeringThin filmdescription
Abstract Radiation effects in highly oriented Pb1Zr0.53Ti0.47O3 (PZT), Pb0.94La0.06Zr0.65Ti0.35O3 (PLZT-6), and PbiZriO3 (PZ) ferroelectric (FE) and antiferroelectric (AF) thin films are investigated in view of their possible application as a temperature sensitive element in a new bolometer system for ITER (International Thermonuclear Experimental Reactor). The dielectric properties (i.e. hysteresis loops, dielectric constants) of the films were investigated in a frequency range from 20 to 105 Hz and at temperatures up to 450 °C, before and after neutron irradiation to a neutron fluence of 5×1021 m−2 (E<0.1 MeV). The dielectric constant was measured during cooling with 1.7 °Cmin−1. The dielectric properties of the films were assessed before and after annealing in several steps up to 490 °C to remove the radiation induced defects.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-01-01 | Integrated Ferroelectrics |