6533b82cfe1ef96bd128f4bb
RESEARCH PRODUCT
Dangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis
J. L. Hernandez AmbatoG. PriviteraGiuseppe ConsentinoM. MazzeoElio Angelo TomarchioCalogero PaceC. GiordanoAldo ParlatoM. LaudaniN. Marchesesubject
PhysicsNuclear engineeringEmphasis (telecommunications)Photovoltaic systemElectronic engineeringNeutronPower MOSFETNeutron irradiationdescription
This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biased during their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called “Single Event Effects” (SEE)), the results of an accelerated test performed with the Am-Be source at the University of Palermo are discussed.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2013-10-01 |