6533b82dfe1ef96bd1291348

RESEARCH PRODUCT

Time-of-flight - Energy spectrometer for elemental depth profiling - Jyväskylä design

Timo SajavaaraJaakko JulinMikko RossiMikko Laitinen

subject

ToF-ERDANuclear and High Energy Physicstiming gateMaterials scienceIon beam analysista114SpectrometerHydrogenbusiness.industryDetectorchemistry.chemical_elementelemental depth profilingion beam analysistime-of-flightElastic recoil detectionTime of flightData acquisitionOpticschemistryCoincidentbusinessInstrumentation

description

Abstract A new time-of-flight elastic recoil detection spectrometer has been built, and initially the main effort was focused in getting good timing resolution and high detection efficiency for light elements. With the ready system, a 154 ps timing resolution was recorded for scattered 4.8 MeV 4 He 2+ ions. The hydrogen detection efficiency was from 80% to 20% for energies from 100 keV to 1 MeV, respectively, and this was achieved by having an additional atomic layer deposited Al 2 O 3 coating on the first timing detector’s carbon foil. The data acquisition system utilizes an FPGA-card to time-stamp every time-of-flight and energy event with 25 ns resolution. The different origins of the background events in coincident time-of-flight-energy histograms have been studied and explained. The built system has proved to be able to routinely depth profile films thinner than 10 nm.

http://urn.fi/URN:NBN:fi:jyu-201501211155