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RESEARCH PRODUCT
Two-LO-Phonon Resonant Raman Scattering in II-VI Semiconductors
W. LimmerA. Garcí-cristóbalAndrés CantareroCarlos Trallero-ginersubject
Condensed matter physicsScatteringPhononChemistryExcitonDiscrete dipole approximationCondensed Matter PhysicsElectronic Optical and Magnetic Materialssymbols.namesakeX-ray Raman scatteringsymbolsAtomic physicsRaman spectroscopyRaman scatteringOrder of magnitudedescription
Recently, absolute values of socond-order Raman scattering efficiency have been measured around the E 0 and E 0 + Δ 0 critical points of several II-VI semiconductor compounds. The measurements were perfomed in the z(x,x)z backscattering configuration on (001) (ZnSe and ZnTe) and (110) (CdTe) surfaces. They show strong incoming and outgoing resonances around the baud gap and larger scattering efficiencies as compaered to III-V compounds. A theoretical model which includes excitons as intermediate states in the Raman process is shown to give a very good quantitative agreement between theory and experiment. Only a small discrepancy exists, while III-V compounds the discrepancies were close to one order of magnitude. A discussion of the differences in the scattering efficciencies between II-VI and III-V compounds is also reported.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1996-08-01 |