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RESEARCH PRODUCT
In situ measurement of the kinetic friction of ZnO nanowires inside a scanning electron microscope
Alexey E. RomanovAnts LõhmusRynno LohmusBoris PolyakovBoris PolyakovLeonid M. Doroginsubject
Materials scienceSiliconScanning electron microscopeNanowireGeneral Physics and Astronomychemistry.chemical_elementNanotechnologySurfaces and InterfacesGeneral ChemistryCondensed Matter PhysicsSurfaces Coatings and FilmsCondensed Matter::Materials ScienceHighly oriented pyrolytic graphitechemistryNanotribologyWaferGraphiteComposite materialActuatordescription
Abstract A novel method for measuring the kinetic friction force in situ was developed for zinc oxide nanowires on highly oriented pyrolytic graphite and oxidised silicon wafers. The experiments were performed inside a scanning electron microscope and used a nanomanipulation device as an actuator, which also had an atomic force microscope tip attached to it as a probe. A simple model based on the Timoshenko elastic beam theory was applied to interpret the elastic deformation of a sliding nanowire (NW) and to determine the distributed kinetic friction force.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2012-01-01 | Applied Surface Science |