6533b831fe1ef96bd1298436
RESEARCH PRODUCT
Magneto-optical linear dichroism in threshold photoemission electron microscopy of polycrystalline Fe films.
Gerd SchönhenseHans-joachim ElmersG.k.l Marxsubject
Polarized light microscopyMaterials scienceKerr effectMagnetic domainbusiness.industryPhysics::OpticsGeneral Physics and AstronomyDichroismLinear dichroismMolecular physicslaw.inventionCondensed Matter::Materials SciencePhotoemission electron microscopyOpticslawCondensed Matter::SuperconductivityElectron microscopebusinessVisible spectrumdescription
Magnetic linear dichroism in threshold photoemission has been exploited to obtain magnetic contrast in a photoemission electron microscope using a mercury arc lamp. The dichroism at threshold can be described similar to the magneto-optical Kerr effect in the region of visible light. The asymmetry of electron intensity observed for a 100 nm polycrystalline Fe film on silicon is A=(0.37+/-0.05)%. The asymmetry occurs for the geometry of the transverse Kerr effect. For unpolarized light the asymmetry was about half the value observed for linearly polarized light. Threshold photoemission microscopy has a large potential for high resolution magnetic domain imaging with fast data acquisition.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2000-06-19 | Physical review letters |