6533b835fe1ef96bd129e972

RESEARCH PRODUCT

Ultra Trace Determination Scheme for26Al by High-Resolution Resonance Ionization Mass Spectrometry using a Pulsed Ti:Sapphire Laser

T. KesslerT. KesslerC. MattolatTetsuo IguichiHideki TomitaHideki TomitaSebastian RaederKlaus WendtKlaus WendtKenichi WatanabeF. Schwellnus

subject

Nuclear and High Energy PhysicsChemistryTi:sapphire laserAnalytical chemistryLaserMass spectrometrylaw.inventionAtmospheric-pressure laser ionizationNuclear Energy and EngineeringlawIonizationResonance ionizationSapphireUltra trace

description

We propose an ultra trace analysis approach for 26Al by high-resolution Resonance Ionization Mass Spectrometry (RIMS) using a pulsed narrow band-width Ti:Sapphire laser. For ensuring efficient ionization and high isotopic selectivity in RIMS of Al, we developed an injection seeded pulsed Ti:Sapphire laser with high repetition rate operation at up to 10 kHz. The laser produced an output power of 2 W and a spectral band-width of ~20 MHz with a repetition rate of 7 kHz. A first demonstration of its performance was done by detecting stable 27Al using RIMS.

yearjournalcountryeditionlanguage
2008-09-01Journal of Nuclear Science and Technology
https://doi.org/10.1080/00223131.2008.10875974