6533b838fe1ef96bd12a3dee
RESEARCH PRODUCT
Influence of the Number of Nanoparticles on the Enhancement Properties of Surface-Enhanced Raman Scattering Active Area: Sensitivity versus Repeatability
Georges LéviJérémie MargueritatJérémie MargueritatCarmen Marco De LucasEric FinotJohan GrandHélène GehanJean AubardAlexandre BouhelierLaurent MarkeyGérard Colas-des-francsNordin FélidjAlain Dereuxsubject
Materials scienceLightMacromolecular SubstancesSurface PropertiesMolecular ConformationGeneral Physics and AstronomyNanoparticleNanotechnology02 engineering and technologySpectrum Analysis Raman010402 general chemistry01 natural sciencessymbols.namesakeMaterials TestingScattering RadiationGeneral Materials ScienceSensitivity (control systems)Particle SizeSurface plasmon resonanceComputingMilieux_MISCELLANEOUS[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]General Engineering021001 nanoscience & nanotechnologyNanostructures0104 chemical sciencesColloidal goldsymbolsSurface modificationCrystallization0210 nano-technologyElectron-beam lithographyExcitationRaman scatteringdescription
In the present work, the combination of chemical immobilization with electron beam lithography enables the production of sensitive and reproducible SERS-active areas composed of stochastic arrangements of gold nanoparticles. The number of nanoparticles was varied from 2 to 500. Thereby a systematic analysis of these SERS-active areas allows us to study SERS efficiency as a function of the number of nanoparticles. We found that the experimental parameters are critical, in particular the size of the SERS-active area must be comparable to the effective area of excitation to obtained reproducible SERS measurements. The sensitivity has also been studied by deducing the number of NPs that generate the enhancement. With this approach we demonstrates that the maximum enhancement, the best sensitivity, is obtained with the smallest number of nanoparticles that is resonant at a given excitation wavelength.
year | journal | country | edition | language |
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2011-02-25 | ACS Nano |