6533b839fe1ef96bd12a621f
RESEARCH PRODUCT
Pattern image enhancement by extended depth of field
Samuel ChefBastien BilliotSabir JacquirKevin SanchezPhilippe PerduStéphane Binczaksubject
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processingComputingMilieux_MISCELLANEOUS[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processingdescription
International audience
year | journal | country | edition | language |
---|---|---|---|---|
2014-01-01 |