6533b853fe1ef96bd12ad680

RESEARCH PRODUCT

Pattern projection for subpixel resolved imaging in microscopy.

Zeev ZalevskyJavier GarciaDror FixlerAryeh WeissMordechai Deutsch

subject

PhysicsMicroscopePixelbusiness.industryResolution (electron density)DetectorComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONGeneral Physics and AstronomyCell BiologySubpixel renderingSample (graphics)law.inventionOpticsStructural BiologylawComputer Science::Computer Vision and Pattern RecognitionMicroscopyGeneral Materials SciencebusinessProjection (set theory)

description

In this paper, we present a new approach providing super resolved images exceeding the geometrical limitation given by the detector pixel size of the imaging camera. The concept involves the projection of periodic patterns on top of the sample, which are then investigated under a microscope. Combining spatial scanning together with proper digital post-processing algorithm yields the improved geometrical resolution enhancement. This new method is especially interesting for microscopic imaging when the resolution of the detector is lower than the resolution due to diffraction.

yearjournalcountryeditionlanguage
2006-12-05Micron (Oxford, England : 1993)
10.1016/j.micron.2006.07.007https://pubmed.ncbi.nlm.nih.gov/17140798