0000000000718673
AUTHOR
Aryeh Weiss
Speckle random coding for 2D super resolving fluorescent microscopic imaging.
In this manuscript we present a novel super resolving approach based upon projection of a random speckle pattern onto samples observed through a microscope. The projection of the speckle pattern is created by coherent illumination of the inspected pattern through a diffuser. Due to local interference of the coherent wave front with itself, a random speckle pattern is superimposed on the sample. This speckle pattern can be scanned over the object. A super-resolved image can be extracted from a temporal sequence of images by appropriate digital processing of the image stream. The resulting resolution is significantly higher than the diffraction limitation of the microscope objective. The new …
One-dimensional wavelength multiplexed microscope without objective lens
A new approach aimed to achieve microscopic imaging without objective lenses and based on wavelength multiplexing of the spatial object information is presented. The proposed method is used to develop, construct and experimentally validate a new type of optical microscope having no objective lens and no numerical reconstruction algorithms to allow imaging process. In order to extract the collected spatial information we use a spectrometer as part of our microscope system. Preliminary results are presented while considering two different types of one-dimensional (1-D) objects.
Pattern projection for subpixel resolved imaging in microscopy.
In this paper, we present a new approach providing super resolved images exceeding the geometrical limitation given by the detector pixel size of the imaging camera. The concept involves the projection of periodic patterns on top of the sample, which are then investigated under a microscope. Combining spatial scanning together with proper digital post-processing algorithm yields the improved geometrical resolution enhancement. This new method is especially interesting for microscopic imaging when the resolution of the detector is lower than the resolution due to diffraction.