6533b857fe1ef96bd12b4cc3
RESEARCH PRODUCT
High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP
Andreas SoldersR. SchuchMarkus SuhonenKlaus BlaumTomas FritioffI. BergströmSz. NagySz. Nagysubject
HistoryChemistryBound stateIonic bondingElectronIon trapAtomic physicsPenning trapMass spectrometryComputer Science ApplicationsEducationIondescription
The Penning trap mass spectrometer SMILETRAP takes advantage of highly-charged ions for high-accuracy mass measurements. In this paper recent mass measurements on Li and Ca ions are presented and their impact on fundamental applications discussed, especially the need for accurate mass values of hydrogen-like and lithium-like ions in the evaluation of the electron g-factor measurements in highly-charged ions is emphasized. Such experiments aim to test bound state quantum electrodynamics. Here the ionic mass is a key ingredient, which can be the limiting factor for the final precision.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2007-03-01 | Journal of Physics: Conference Series |