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RESEARCH PRODUCT
Multiscale analyses and characterizations of surface topographies
Johan BerglundFrançois BlateyronGaëtan Le GoïcMary Kathryn ThompsonPeter S. UngarXiang Jane JiangNicola SeninNicola SeninYann QuinsatHans Nørgaard HansenE. Hassan ZahouaniW. James StempBarnali M. DixonTomasz BartkowiakChristopher A. Brownsubject
Surface (mathematics)0209 industrial biotechnologyComputed-TomographyComputer scienceArea Structure-FunctionComputed tomography02 engineering and technologyWavelet Transformcomputer.software_genreMetrologyIndustrial and Manufacturing Engineering[SPI]Engineering Sciences [physics]020901 industrial engineering & automationmedicineProduction engineeringDimensional MetrologyQuantitative-AnalysisPhysics::Atmospheric and Oceanic Physicsmedicine.diagnostic_testRough SurfacesMechanical EngineeringFractal Analysis021001 nanoscience & nanotechnologyEngineering SurfacesFractal analysisRoughnessSurfaceMetrology; Roughness; Surface; Mechanical Engineering; Industrial and Manufacturing EngineeringData miningUbm Laser Profilometry0210 nano-technologyDental Microwear Texturecomputerdescription
International audience; This work studies multiscale analyses and characterizations of surface topographies from the engineering and scientific literature with an emphasis on production engineering research and design. It highlights methods that provide strong correlations between topographies and performance or topographies and processes, and methods that can confidently discriminate topographies that were processed or that perform differently. These methods have commonalities in geometric characterizations at certain scales, which are observable with statistics and measurements. It also develops a semantic and theoretical framework and proposes a new system for organizing and designating multiscale analyses. Finally, future possibilities for multiscale analyses are discussed. (C) 2018 Published by Elsevier Ltd on behalf of CIRP.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2018-01-01 |