6533b859fe1ef96bd12b6f89

RESEARCH PRODUCT

Measurements of thickness dispersion in biolayers by scanning force microscopy and comparison with spectroscopic ellipsometry analysis.

Eric FinotRita Meunier-prestGuillaume LegayLaurent Markey

subject

Materials scienceAnalytical chemistry02 engineering and technology010402 general chemistryMicroscopy Atomic Force01 natural sciencesEllipsometryMicroscopySurface plasmon resonanceInstrumentationComputingMilieux_MISCELLANEOUSbusiness.industrySelf-assembled monolayerMembranes ArtificialDNATribologySurface Plasmon Resonance021001 nanoscience & nanotechnologyAtomic and Molecular Physics and Optics0104 chemical sciencesElectronic Optical and Magnetic MaterialsMembraneself-assembled monolayerSelective adsorptionOptoelectronicsAFM0210 nano-technologybusinessDispersion (chemistry)ellipsometryheight

description

Measuring the thickness of biological films remains a difficult task when using differential measurements by atomic force microscopy (AFM). The use of microstructured substrates combined with a selective adsorption constitutes an alternative to tribological measurements. The statistical thickness analysis of biological layers, especially via the dispersion measurements, can provide a way to quantify the molecular orientation. AFM thicknesses were then compared with those obtained optically by spectroscopic ellipsometry (SE) and surface plasmon resonance enhanced ellipsometry (SPREE). The biolayers could then be modeled using a vertical gradient of optical index, which reflects height dispersions. Thiol-modified DNA strands of various lengths account for a good biological model for the study of the strand motion in air and in liquid.

yearjournalcountryeditionlanguage
2007-01-01Ultramicroscopy
10.1016/j.ultramic.2007.02.043https://pubmed.ncbi.nlm.nih.gov/17582684