6533b85afe1ef96bd12b9503
RESEARCH PRODUCT
Laser tests of silicon detectors
Sergio Iniesta GonzálezG.f. MoorheadRadan SlavíkSalvador MartiPhilip PhillipsPetr KubíkSzymon GadomskiZ. DoležalP. ŘEzníčekCarmen GarcíaPeter KodysCarlos LacastaC. EscobarVasiliki A Mitsousubject
PhysicsNuclear and High Energy PhysicsPixelSiliconPhysics::Instrumentation and Detectorsbusiness.industryDetectorPhysics::Opticschemistry.chemical_elementLaserlaw.inventionSemiconductor laser theorySemiconductor detectorchemistrylawOptoelectronicsPhysics::Atomic PhysicsbusinessInstrumentationDiodedescription
This paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680 nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2007-04-01 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |